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Applied logistic regression

By: Hosmer, David W.
Contributor(s): Lemeshow, Stanley.
Material type: materialTypeLabelBookSeries: Wiley Series In Probability And Statistics / Edited By David J. Balding. Publisher: New Jersey John Wiley & Sons 2013Edition: 3rd.Description: xvi, 500p.ISBN: 9780470582473.Subject(s): Regression analysisDDC classification: 519.536 | H794a3
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Item type Current location Collection Call number Status Date due Barcode Item holds
Books Books PK Kelkar Library, IIT Kanpur
General Stacks 519.536 H794a3 (Browse shelf) Available A177821
Total holds: 0

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